I. Overview

JK9610A-type power FET tester, is a new all-digital display power FET parameter test device can be used for nominal current of about 2-85A, 300W power within the N-channel power FET main Which can accurately measure the breakdown voltage VDSS, gate turn-on voltage VGS (th) and amplification characteristics of the transconductance Gfs, especially the transconductance Gfs test current can reach 50A, the use of pulse current test method, even in the High-current test will not cause any damage to the device under test, but also in the high-current state of the FET for parameter consistency testing (matching); instrument can be used for the same current level of the IGBT parameter measurement; Or a very superior performance of the electronic components of the pressure test device, the test pressure when the leakage current 1mA, 250uA, 25uA three gear can be selected.The instrument is mainly used for power FET and IGBT quality inspection, parameter And other electronic components of the pressure test. Instrument divided into N-channel conductivity tester and P-channel conductivity tester two. Instrument appearance, stable performance, accurate measurement, simple operation, the use of safe and convenient.

Second, the main technical performance

1, the breakdown voltage VDSS Measuring range: 0-1999V, accuracy: ≤ 2.5%.
2, IDSS can be divided into three block selection: 1mA, 250uA, 25uA.
3, the gate opening voltage VGS (th) Measuring range: 0-10V. Accuracy: ≤ 5%.
4, Gfs transconductance test current Idm: not less than 1-50 A continuously adjustable, accuracy: ≤ 10%.
5, Gfs transconductance test range: 1-100.

Third, the main test function

1, the power FET breakdown voltage VDSS, gate turn-on voltage VGS (th), transconductance Gfs test.
2, IGBT breakdown voltage V (BR) ces, gate turn-on voltage VGE (th), transconductance Gfs test.
3, power FET and IGBT under 50A in any current state consistency test can be used for matching.
4, the other greater current and power FET and IGBT test: (see below).
5, all kinds of crystal transistors, diodes, voltage regulator tube breakdown voltage test.
6, the varistor voltage test.

Fourth, the test box and test line

1, using the test box can be easily tested TO-126, TO-220, TOP-3 and other similar packages of power FET and IGBT.
2, the use of test lines can be measured in other metal, module and other forms of packaging power FET and IGBT.